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机译:高温氧化延长载流子寿命对15 kV 4H-SiC P-GTO晶闸管的影响
Wolfspeed, a Cree Company, RTP, NC, USA;
Wolfspeed, a Cree Company, RTP, NC, USA;
Wolfspeed, a Cree Company, RTP, NC, USA;
Wolfspeed, a Cree Company, RTP, NC, USA;
Wolfspeed, a Cree Company, RTP, NC, USA;
Wolfspeed, a Cree Company, RTP, NC, USA;
Wolfspeed, a Cree Company, RTP, NC, USA;
Wolfspeed, a Cree Company, RTP, NC, USA;
Wolfspeed, a Cree Company, RTP, NC, USA;
Wolfspeed, a Cree Company, RTP, NC, USA;
Wolfspeed, a Cree Company, RTP, NC, USA;
U.S. Army Research Laboratory, Adelphi, MD, USA;
U.S. Army Research Laboratory, Adelphi, MD, USA;
U.S. Army Research Laboratory, Adelphi, MD, USA;
Wolfspeed, a Cree Company, RTP, NC, USA;
Wolfspeed, a Cree Company, RTP, NC, USA;
Wolfspeed, a Cree Company, RTP, NC, USA;
Wolfspeed, a Cree Company, RTP, NC, USA;
Carrier lifetime; high voltage; thyristor; latching; holding current;
机译:通过提高载流子寿命来改善4H-SiC P-GTO晶闸管的阻隔性能
机译:温度和注入水平的依赖性以及热氧化对p型和n型4H-SiC外延层中载流子寿命的影响
机译:n型4H-SiC的高温退火:对固有缺陷和载流子寿命的影响
机译:高温氧化提高载流子寿命对15 kV 4H-SiC P-GTO晶闸管的影响
机译:通过砷和锑的离子注入,提高了劣质硅中少数载流子的寿命。
机译:用于非接触氧化过程表征和炉分析的少数载流子寿命测量
机译:温度和注入水平的依赖性以及热氧化对p型和n型4H-SiC外延层中载流子寿命的影响