To the reliability of X-ray texture measurements: Important parameters, measuring strategies, Scatter bands and comparative measurements With different systems

摘要

The dependency of x-ray texture measurements from several im- portant hardware parameters is shown. The consequences of differ- ent usual measuring strategies onto the resulting ODF are presented and the efficiency of the used correction method I investigated. A new 2-dimensional correction routine is developed as well as a new selfcorrection test for the quality judgement of the correction meth- od. Scatter bands of one measurement, one goniometer system and in comparison of different goniometer systems are presented.