Scatter parameter measurement method for measuring the scatter parameters of a multiple gate, in which a correction calculation is carried out to compensate for the use of reflecting gate connections

摘要

Measurement method for measuring the scatter parameters of a multiple gate (32) that has multiple gates (33 1-33 n) using a calibrated 2-gate network analyzer. According to the method, external reflecting connections (35 1-35 n) to the gate are used that are not matched to the gate impedances (33 1-33 n). The influence of the reflection from the reflecting connections is eliminated using a correction calculation and the error-corrected scatter parameters of the multiple gate are determined. An independent claim is made for a device for measuring the scatter parameters of a multiple gate.