Investigation of pearlite structure by means of electron backscatter diffraction and image analysis of SEM micrographs with an application of the Hough transform

摘要

A new approach to characterization of the microstructure of pearlite is presented. It consists of image analysis (IA) and electron backscatter diffraction (EBSD) investigation. The IA program performs automated separation and comprehensive characterization of both lamellar and globular fractions of the microstructure. EBSD results are also presented which show that the crystallographic orientation of the pearlite matrix exhibits changes inside one colony. The analysis shows also proofs for a multicolonial growth mode of pearlite.