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Mechanisms of void formation during uniaxial tensile testing in a low- temperature-aged U-Nb alloy

机译:低温时效U-Nb合金单轴拉伸试验过程中空洞形成的机理

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摘要

The microstructure and damage accumulation of a U-5.5Nb alloy aged at a low temperature were analysed as a function of strain. Four tensile tests were performed and interrupted at different strain levels to investigate the mechanisms of void nucleation, growth and coalescence via optical microscopy, scanning electron microscopy with energy dispersive X-ray spectroscopy, X-ray diffraction and nanoindentation measurements. The results show that voids first nucleate at U(N,C) inclusions at a low strain because they crack due to their low strength. Meanwhile, the higher strength of the Nb2C inclusion than that of matrix does not lead to the fracturing of Nb2C inclusions. However, with the further increasing strain, voids nucleate via the decohesion of the Nb2C-matrix interface because of the mismatch between the strengths of the Nb2C inclusion and matrix. In clusters comprising both Nb2C and U(N,C) inclusions, void formation mechanisms are determined by the Nb2C and U(N,C) inclusions. In addition, in clusters, the weak adhesion between Nb2C and U(N,C) inclusions causes separation. Based on experimental observations, an illustration of failure mechanisms is presented for a low-temperature-aged U-5.5Nb alloy with a single α′′ phase.
机译:分析了在低温下时效的U-5.5Nb合金的微观结构和损伤累积,作为应变的函数。进行了四个拉伸试验,并在不同的应变水平下进行了中断试验,以通过光学显微镜,具有能量色散X射线光谱的扫描电子显微镜,X射线衍射和纳米压痕测量研究空隙形核,生长和聚结的机理。结果表明,空洞首先以低应变在U(N,C)夹杂物上成核,因为它们由于强度低而破裂。同时,Nb2C夹杂物的强度高于基体的强度不会导致Nb2C夹杂物的破裂。但是,随着应变的进一步增加,由于Nb2C夹杂物和基体的强度不匹配,空隙会通过Nb2C-基体界面的脱粘而形核。在同时包含Nb2C和U(N,C)夹杂物的团簇中,空洞形成机理由Nb2C和U(N,C)夹杂物决定。此外,在簇中,Nb2C和U(N,C)夹杂物之间的弱附着力导致分离。基于实验观察,给出了具有单α'′相的低温时效U-5.5Nb合金的失效机理的图示。

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