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Co-doping of sulfur and boron in CVD-diamond

机译:CVD金刚石中硫和硼的共掺​​杂

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Diamond films had been grown by microwave plasma-assisted CVD using acetone diluted in hydrogen. Sulfur incorporation in diamond was achieved by co-doping method using dimethyl disulfide and boron dioxide. Structural and compositional characterization of the as-grown films was carried out by scanning electron microscopy (SEM), Raman spectrum, auger electron spectrometer (AES) and particle-induced X-ray emission (PIXE). AES and PIXE analyses confirmed that the sulfur was successfully introduced into diamond films. N-type conduction of the films was confirmed by Seebeck-effect measurements. The donor activity of the sulfur decreased from 0.52 to 0.39 eV with Increasing of S incorporation into diamond. Results indicated that boron facilitated the sulfur into diamond via co-doping method.
机译:金刚石膜已通过微波等离子体辅助CVD使用稀释在氢气中的丙酮生长。金刚石中硫的掺入是通过使用二甲基二硫和二氧化硼的共掺杂方法实现的。通过扫描电子显微镜(SEM),拉曼光谱,俄歇电子能谱仪(AES)和粒子诱导的X射线发射(PIXE)对生长的薄膜进行结构和成分表征。 AES和PIXE分析证实了硫已成功引入金刚石膜中。通过塞贝克效应测量证实了膜的N型传导。随着S掺入金刚石的增加,硫的供体活性从0.52 eV下降到0.39 eV。结果表明,硼通过共掺杂法促进了硫进入金刚石。

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