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Electrodeposition of SmS optical thin films on ITO glass substrate

机译:在ITO玻璃基板上电沉积SmS光学薄膜

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摘要

SmS optical thin films were deposited on the surface of ITO glass with an electrodeposition method using aqueous solution containing SmCl_3·6H_2O and Na_2S_2O_3·5H_2O. The phase composition was analyzed by X-ray diffraction (XRD) and microstructure of the film was characterized by atomic force microscope (AFM). It is showed that SmS thin film could be obtained in the solution with n(Sm)(S)= 1:4, pH=4.0 and annealing in Ar atmosphere at 200℃ for 0.5 h. The as-prepared thin films on the ITO glass exhibit a dense microstructure. The band gap of the thin film has been found to be 3.6 eV.
机译:使用包含SmCl_3·6H_2O和Na_2S_2O_3·5H_2O的水溶液,通过电沉积方法在ITO玻璃表面上沉积SmS光学薄膜。通过X射线衍射(XRD)分析相组成,并通过原子力显微镜(AFM)表征膜的微观结构。结果表明,在n(Sm)/ n(S)= 1:4,pH = 4.0,在Ar气氛中于200℃退火0.5h的溶液中可获得SmS薄膜。 ITO玻璃上准备好的薄膜表现出致密的微观结构。薄膜的带隙为3.6eV。

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