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Dielectric properties of low temperature sintered LiF doped BaFe_(0.5)Nb_(0.5)O_3

机译:低温烧结掺杂LiF的BaFe_(0.5)Nb_(0.5)O_3的介电性能

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Sintering of BaFe_(0.5)Nb_(0.5)O_3:BFN requires the use of high temperatures to achieve satisfactoiy densifieation of this material. The aim of this study is to determine the effect of LiF on the sintering and electrical properties of BFN ceramics (the LiF was added as a sintering agent). The results show that LiF lowers the sintering temperature by 150-200 deg C without affecting the formation of BFN. Ceramics doped with 2-3 percent LiF show optimum densities of about 93-94 percent of the theoretical value when sintered at low temperatures (1000-1100 deg C). Samples containing 2-3 percent LiF show the following dielectric behaviour. The dielectric constant curves are very broad over a wide temperature range, with room-temperature values of 7154 in the 2 percent LiF sample and 2527 in the 3 percent LiF sample. The dielectric constants gradually increase up to 300 deg C to values of about 38,862 in the 2 percent LiF sample and 40,471 in the 3 percent LiF sample. Furthermore, the addition of 2-3 percent LiF to BFN causes a reduction in the room-temperature dielectric loss from 4.29 in undoped BFN to less than 1.2 for LiF-containing samples.
机译:BaFe_(0.5)Nb_(0.5)O_3:BFN的烧结需要使用高温来实现该材料的令人满意的致密化。这项研究的目的是确定LiF对BFN陶瓷的烧结和电性能的影响(添加LiF作为烧结剂)。结果表明,LiF将烧结温度降低了150-200摄氏度,而没有影响BFN的形成。掺杂2-3%LiF的陶瓷在低温(1000-1100℃)下烧结时,其最佳密度约为理论值的93-94%。含有2-3%LiF的样品显示出以下介电行为。介电常数曲线在很宽的温度范围内非常宽,在2%LiF样品中室温值为7154,在3%LiF样品中室温值为2527。介电常数逐渐升高到300摄氏度,在2%LiF样品中约为38,862,在3%LiF样品中约为40,471。此外,向BFN中添加2-3%的LiF会使室温介电损耗从未掺杂BFN中的4.29降低到含LiF样品的1.2以下。

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