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Microwave characteristics of soft magnetic materials: FeZrN thin films and their dependence on nitrogen concentration

机译:软磁材料FeZrN薄膜的微波特性及其对氮浓度的依赖性

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Ferromagnetic resonance (FMR) studies of FeZrN films prepared by RF sputtering with N_2 partial pressure=0.05, 0.075, 0.10 and 0.15 are used to determine their microwave characteristics. These room temperature studies at 9.29 GHz and for in-plane orientation of the applied field H show that both the resonance field H_r and the line-width ΔH have 180° symmetry representing uniaxial anisotropy H_k. However with increase in x, H_k decreases but ΔH and H_r increase. The calculated cut-off FMR frequency for H=0 systematically decreases from 1.62 GHz for x=0.05 to 1.34 GHz for x=0.15. This suggests that the film with x=0.05 has the best overall microwave properties for high-frequency applications.
机译:用N_2分压分别为0.05、0.075、0.10和0.15的RF溅射制备的FeZrN薄膜的铁磁共振(FMR)研究用于确定其微波特性。这些在9.29 GHz的室温研究以及施加场H的面内取向表明,共振场H_r和线宽ΔH均具有180°对称性,代表单轴各向异性H_k。但是,随着x的增加,H_k减小,而ΔH和H_r增大。对于H = 0,计算得出的截止FMR频率从x = 0.05的1.62 GHz到x = 0.15的1.34 GHz逐渐降低。这表明对于高频应用,x = 0.05的薄膜具有最佳的总体微波性能。

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