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The Peculiar Role of the Third Element Indium in Density of Defect States of Se_(90)Ge_(10) Thin Films

机译:第三元素铟在Se_(90)Ge_(10)薄膜缺陷态密度中的特殊作用

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摘要

The present paper reports the space charge limited conduction (SCLC) measurements in Se_(90)Ge_(10-x)ln_x (x = 2, 6) amorphous thin films. For this purpose, Ⅰ-Ⅴ measurements have been taken at different temperatures. The results show that an ohmic behavior is observed at low electric fields (E< 10~3 V/cm) while, at higher electric fields (E~10~4 V/cm), a super-ohmic behavior is observed. An analysis of the experimental data confirms the presence of space charge limited conduction (SCLC) in the present glassy materials. Density of defect states (DOS) near Fermi level is calculated by fitting the data to SCLC theory. The peculiar role of the third element Indium, as an impurity in Se_(90)Ge_(10) binary glassy alloy, is also discussed in terms of electro-negativity difference between the constituent elements.
机译:本文报道了Se_(90)Ge_(10-x)ln_x(x = 2,6)非晶薄膜中的空间电荷限制传导(SCLC)测量。为此,在不同温度下进行了Ⅰ-Ⅴ级测量。结果表明,在低电场(E <10〜3 V / cm)下观察到了欧姆行为,在高电场(E〜10〜4 V / cm)下观察到了超欧姆行为。对实验数据的分析证实了在当前玻璃态材料中存在空间电荷限制传导(SCLC)。通过使数据符合SCLC理论,可以计算出接近费米能级的缺陷状态(DOS)的密度。还根据构成元素之间的电负性差异,讨论了第三元素铟在Se_(90)Ge_(10)二元玻璃态合金中作为杂质的特殊作用。

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