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The role of sulfur alloying in defects and transitions in copper indium gallium diselenide disulfide thin films.

机译:硫合金化在铜铟镓二硒二硫化物薄膜的缺陷和过渡中的作用。

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摘要

The effects of sulfur alloying on the electronic properties of CuIn(SeS) 2 and CuInGa(SeS)2 materials has been investigated using sophisticated junction capacitance techniques including drive-level capacitance profiling and transient photocapacitance and photocurrent spectroscopies. CISSe and CIGSSe materials are used as absorber layers in thin-film photovoltaic devices. By characterizing the electronic properties of these materials we hope to understand how these materials can be improved to make thin-film devices with better conversion efficiencies. Sulfur widens the bandgap of these materials by moving the valence band to lower energies and the conduction band to higher energies. This significantly affects the electronic structure of these devices by increasing the activation energies of dominant acceptor levels and lowering room temperature free hole carrier densities. Using optical spectroscopies we observe a large, broad defect that also changes its apparent energetic depth with sulfur alloying. The occupation of this defect was controlled both optically and thermally, and showed a striking temperature dependence. This temperature dependence was measured by recording the relative defect signal, the ratio of the TPC signal in the defect regime to the above bandgap regime, as a function of temperature. As the temperature of the measurement was decreased, steps in the relative defect signal were observed, indicating the turning off of the thermal pathway that emptied trapped charge from the defect. Remarkably, such steps were seen at the same temperature in CISSe and CIGSSe devices with similar sulfur content. In addition, no steps were seen in CMS devices. This points to a defect state specific to the incorporation of sulfur in the absorber material. We hope that a better understanding of the electronic structure of these materials will assist in the creation of improved wide-bandgap thin-film photovoltaic devices.
机译:已经使用复杂的结电容技术研究了硫合金化对CuIn(SeS)2和CuInGa(SeS)2材料电子性能的影响,这些技术包括驱动级电容分布以及瞬态光电容和光电流谱。 CISSe和CIGSSe材料用作薄膜光伏器件中的吸收层。通过表征这些材料的电子特性,我们希望了解如何改进这些材料,以制造具有更高转换效率的薄膜器件。硫通过将价带移动到较低的能量,并将导带移动到较高的能量,从而扩大了这些材料的带隙。通过增加主要受体能级的活化能并降低室温自由空穴载流子密度,这会显着影响这些器件的电子结构。使用光谱学,我们观察到一个大而广泛的缺陷,该缺陷也随着硫合金化而改变了其明显的高能深度。通过光学和热控制该缺陷的占据,并显示出惊人的温度依赖性。通过记录相对缺陷信号,缺陷状态下TPC信号与上述带隙状态之间的比率作为温度的函数来测量温度依赖性。随着测量温度的降低,观察到相对缺陷信号中的阶跃,表明热通路的关闭,从而从缺陷中清除了捕获的电荷。值得注意的是,在具有相似硫含量的CISSe和CIGSSe设备中,在相同温度下观察到了这些步骤。此外,在CMS设备中未发现任何步骤。这指出了特定于吸收剂材料中掺入硫的缺陷状态。我们希望更好地理解这些材料的电子结构将有助于创建改进的宽带隙薄膜光伏器件。

著录项

  • 作者

    Halverson, Adam Fraser.;

  • 作者单位

    University of Oregon.;

  • 授予单位 University of Oregon.;
  • 学科 Physics Condensed Matter.
  • 学位 Ph.D.
  • 年度 2007
  • 页码 132 p.
  • 总页数 132
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 O49;
  • 关键词

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