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The quality factor of the microwave dielectric materials based on the crystal structure - as an example: the Ba6-3xR8+2xTi18O54 (R = rare earth) solid solutions

机译:基于晶体结构的微波介电材料的品质因数-例如:Ba6-3xR8 + 2xTi18O54(R =稀土)固溶体

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Quality factor (Q: inverse of tan 8), one of the important properties of the microwave dielectric materials, is discussed based on the crystal structure. Dielectric losses (tan 3) are caused by polars generated by disordering of cations and impurities, and also by instability of crystal structure. There are two cases for disordering of cations: one is based on the order-disorder transition; another is based on the cation distribution on the solid solution series. In this paper, a behavior of quality factor was based on the ordering of cations and stability of the crystal structure in the case of the Ba6-3xR8+2xTi18O54 (R = rare earth) solid solutions, and also by impurity of row materials. (C) 2002 Elsevier Science B.V. All rights reserved. [References: 22]
机译:基于晶体结构,讨论了微波介电材料的重要特性之一,品质因数(Q:tan 8的倒数)。介电损耗(tan 3)是由阳离子和杂质的无序产生的极性以及晶体结构的不稳定性引起的。阳离子无序有两种情况:一种是基于有序-无序的转变;另一种是基于无序的转变。另一个是基于固溶体系列的阳离子分布。在本文中,质量因数的行为是基于Ba6-3xR8 + 2xTi18O54(R =稀土)固溶体中阳离子的顺序和晶体结构的稳定性,以及行材料的杂质。 (C)2002 Elsevier Science B.V.保留所有权利。 [参考:22]

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