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Dependence of approaching velocity on the force-distance curve in AFM analysis

机译:AFM分析中逼近速度对力-距离曲线的依赖性

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摘要

The force-distance (F-D) curve in AFM analysis is a useful technique in the field of biophysics and surface science for measuring the physical/chemical properties of a substrate. Herein, the dependence of V. on the F-D curve has been described via a theoretical investigation confirmed with measured data. The results show the attractive force was gradually reduced above a V. of 5 μm/s by increasing the external repulsive force loaded onto the cantilever. To obtain a non-distorted F-D curve, one of two methods should be used: to analyze F-D curve under V. of 1 μm/s or use of a short/stiff cantilever.
机译:AFM分析中的力距(F-D)曲线是生物物理和表面科学领域中用于测量基材的物理/化学性质的有用技术。在本文中,已经通过由测量数据证实的理论研究描述了V.对F-D曲线的依赖性。结果表明,通过增加施加到悬臂上的外部排斥力,吸力逐渐降低到V. 5μm/ s以上。要获得不变形的F-D曲线,应使用以下两种方法之一:在V. 1μm/ s下分析F-D曲线或使用短/刚性悬臂梁。

著录项

  • 来源
    《The Korean journal of chemical engineering 》 |2010年第1期| 324-327| 共4页
  • 作者单位

    Department of Chemical Engineering, Kwangwoon University, Seoul 139-701, Korea;

    School of Chemical & Biological Engineering, Seoul National University, Seoul 151-742, Korea;

    School of Chemical & Biological Engineering, Seoul National University, Seoul 151-742, Korea;

    School of Chemical & Biological Engineering, Seoul National University, Seoul 151-742, Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    AFM; image disrotion; force-distance curve;

    机译:原子力显微镜图像失真;力距曲线;

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