首页> 外文期刊>Key Engineering Materials >Preparation and Properties of Novel Heteroepitaxial Metal/Ferroelectric/Metal/Insulator/Semiconductor (MFMIS) Structure for Pt/Pb(Zr,Ti)O_3/(La,Sr)CoO_3/SrTiO_3/(Ni,Zn,Fe)Fe_2O_4/ (MgO-Al_2O_3)/CeO_2/YSZ/Si Thin Films
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Preparation and Properties of Novel Heteroepitaxial Metal/Ferroelectric/Metal/Insulator/Semiconductor (MFMIS) Structure for Pt/Pb(Zr,Ti)O_3/(La,Sr)CoO_3/SrTiO_3/(Ni,Zn,Fe)Fe_2O_4/ (MgO-Al_2O_3)/CeO_2/YSZ/Si Thin Films

机译:Pt / Pb(Zr,Ti)O_3 /(La,Sr)CoO_3 / SrTiO_3 /(Ni,Zn,Fe)Fe_2O_4 /(MgO)的新型异质外延金属/铁电/金属/绝缘体/半导体(MFMIS)结构的制备和性能-Al_2O_3)/ CeO_2 / YSZ / Si薄膜

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摘要

Heteroepitaxial Pb(Zr,Ti)O_3(PZT)/(La, Sr)CoO_3(LSCO)/SrTiO_3(ST)/(Ni,Zn,Fe)Fe_2O_4(NZF)/(MgO- AL_2O_3)/CeO_2/YSZ/Si(001) stacked thin film was prepared. This film showed both magnetic and ferroelectric properties. LSCO layer was inserted as a "floating gate" in metal-ferroelectrics- metal-insulator-semiconductor (MFMIS) to apply external electrical field on the PZT layer. ST layer was used to allow epitaxial growth of LSCO layer on the NZF layer. To evaluate the effect of both fixed and mobile charges in the stacked thin films, the current-voltage (C-V) measurements were carried out.
机译:异质外延Pb(Zr,Ti)O_3(PZT)/(La,Sr)CoO_3(LSCO)/ SrTiO_3(ST)/(Ni,Zn,Fe)Fe_2O_4(NZF)/(MgO- AL_2O_3)/ CeO_2 / YSZ / Si (001)制备堆叠的薄膜。该膜显示出磁性和铁电性质。 LSCO层作为“浮栅”插入金属铁电体-金属-绝缘体-半导体(MFMIS)中,以在PZT层上施加外部电场。 ST层用于在NZF层上外延生长LSCO层。为了评估堆叠薄膜中固定电荷和移动电荷的影响,进行了电流-电压(C-V)测量。

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