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Near-Infrared Light Emission from Er-doped ZnO Thin Film in Micropits Processed on Si Substrate

机译:Si衬底上微坑中掺Er的ZnO薄膜的近红外光发射

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摘要

We have obtained Er-doped ZnO thin film in a micropattern of reverse trapezoids processed on Si substrate by sputtering and ultrafine polishing techniques. Near-infrared light emission was detected successfully from the thin film filling a single micropit with 10 μm square. Transmission electron microscopy (TEM) observation showed epitaxial growth of ZnO crystals along the curvature of the micropit.
机译:我们通过溅射和超细抛光技术在硅衬底上加工的反向梯形微图案中获得了掺Er的ZnO薄膜。从充满10μm正方形的单个微坑的薄膜中成功检测到近红外光发射。透射电子显微镜(TEM)观察显示ZnO晶体沿微坑的曲率外延生长。

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