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Gas sensing properties of copper gate metal-oxide-semiconductor capacitors

机译:铜栅金属氧化物半导体电容器的气敏特性

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摘要

Metal-oxide-semiconductor capacitors with sputtered 100 nm thick copper gates, operated at 180deg.c, are sensitive to NO_2, with no cross sensitivity either to H_2 or CO, in inert atmospheres and air. Sensitivity to NO is present in air only. Flatband voltages shift positive with NO_2 stimulus, similarly to gold gates of comparable morphology, but responses are an order of magnitude smaller.
机译:在惰性气氛和空气中,具有溅射的100 nm厚铜栅极的金属氧化物半导体电容器在180℃下工作,对NO_2敏感,对H_2或CO无交叉敏感性。对NO的敏感性仅存在于空气中。平坦带电压在NO_2刺激下正向移动,类似于形态相似的金门,但响应小一个数量级。

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