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Development of Thick Film Multichip Module Technology for Micro Miniaturization of Space Electronics

机译:用于航天电子微小型化的薄膜多芯片模块技术的发展

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摘要

Micro miniaturization of space electronic systems by eliminating individual chip packages is attractive not only because of the advantage of reduction in volume and weight but also because of the potential improvement in reliability associated with elimination of one level of interconnection. Latest trend in Microelectronic packaging technology is Multichip Module (MCM) in which multiple bare chips are mounted and interconnected on a substrate. The MCM technology has significant advantages with respect to electrical and thermal performance, size, weight, cost and reliability over conventional discrete device approach. These features make this approach a good choice for space applications. The MCMs are traditionally classified as MCM-L, MCM-D and MCM-C based on substrate fabrication method. All these technologies have their own advantages and applications. This paper presents the development of Fineline and Microvia high density thick film MCM technology classified under MCM-C using Photoimageable Thick film compositions and its comparison with other advanced MCM technologies available. Challenges associated with this technology for space application and materials and processes required to achieve reliable performance are discussed. Qualification tests performed to qualify this technology for space application are also presented. An MCM namely 64 Bit Monitor is developed using this technology and its comparison with existing HMC is also presented in this paper.
机译:通过消除单个芯片封装而使空间电子系统微型微型化之所以具有吸引力,不仅是因为其体积和重量减小的优势,而且还因为消除了一层互连所带来的可靠性方面的潜在提高。微电子封装技术的最新趋势是多芯片模块(MCM),其中多个裸芯片被安装并互连在基板上。与常规分立器件方法相比,MCM技术在电气和热性能,尺寸,重量,成本和可靠性方面具有显着优势。这些功能使该方法成为空间应用的理想选择。基于基板制造方法,传统上将MCM分类为MCM-L,MCM-D和MCM-C。所有这些技术都有自己的优势和应用。本文介绍了使用光成像厚膜组合物在MCM-C下归类的Fineline和Microvia高密度厚膜MCM技术的发展,并将其与其他可用的先进MCM技术进行比较。讨论了与该技术有关的空间应用以及实现可靠性能所需的材料和过程的挑战。还介绍了为使这项技术适用于太空应用而进行的资格测试。使用此技术开发了MCM(即64位监视器),并且还介绍了其与现有HMC的比较。

著录项

  • 来源
    《Journal of Spacecraft Technology》 |2011年第1期|p.1-6|共6页
  • 作者单位

    HMC Division, Indigenization and Components Group, Reliability and Components Area ISRO Satellite Centre, Bangalore - 560 017, India;

    HMC Division, Indigenization and Components Group, Reliability and Components Area ISRO Satellite Centre, Bangalore - 560 017, India;

    HMC Division, Indigenization and Components Group, Reliability and Components Area ISRO Satellite Centre, Bangalore - 560 017, India;

    HMC Division, Indigenization and Components Group, Reliability and Components Area ISRO Satellite Centre, Bangalore - 560 017, India;

    HMC Division, Indigenization and Components Group, Reliability and Components Area ISRO Satellite Centre, Bangalore - 560 017, India;

    HMC Division, Indigenization and Components Group, Reliability and Components Area ISRO Satellite Centre, Bangalore - 560 017, India;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    thick film; mcm; microelectronic packaging; micro vias; hmc;

    机译:厚膜米微电子包装;微型过孔;悍马;

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