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A Stage-Wise Soft-Error Detection Scheme for Flip-Flop Based Pipelines in Secure Cloud Servers

机译:安全云服务器中基于触发器的管道的Stage-Wise软错误检测方案

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The shrinking feature sizes make transistors increasingly susceptible to soft errors, which can severely degrade the systems' RAS (Reliability, Availability, and Serviceability). The tough challenge results from not only increasing SER (soft error rate) of storage cells, but also the increasing susceptibility of combinational logics to soft errors. How to efficiently detect soft errors becomes the primary problem in the Backward Error Recovery (BER) schemes that are cost-effective in soft error tolerance. This paper presents a soft error detection scheme, AUDITOR, for flip-flop based pipelines. The AUDITOR copes with both types of soft errors-single event upset (SEU) and single event transient (SET). We propose a "local-audit" fault detection mechanism, by which each pipeline stage is verified independently and the verifying result registers with a dedicated "audit" bit (V-bit). All the V-bits are distributed across the whole pipeline and synergically monitor the pipeline execution. To relax the constraint of SET detection capability imposed by the inherent fully synchronous operation mode in flip-flop based pipelines, we firstly propose using path-compensation technique to address this constraint. Furthermore, a reuse-based design paradigm is employed to reduce the implementation complexity and area overhead. The AUDITOR possesses robust detection capability and short detection latency, at the expense of about 29 % and 50 % increase in area and power consumption, respectively.
机译:缩小的特征尺寸使晶体管越来越容易受到软错误的影响,这会严重降低系统的RAS(可靠性,可用性和可维护性)。艰巨的挑战不仅是由于存储单元的SER(软错误率)提高,而且是由于组合逻辑对软错误的敏感性增加。如何有效地检测软错误成为后向错误恢复(BER)方案中的主要问题,该方案在软错误容忍方面具有成本效益。本文提出了一种基于触发器流水线的软错误检测方案AUDITOR。 AUDITOR可以处理两种类型的软错误:单事件翻转(SEU)和单事件瞬变(SET)。我们提出了一种“本地审核”故障检测机制,通过该机制,可以独立验证每个流水线阶段,并使用专用的“审核”位(V位)注册验证结果。所有V位都分布在整个流水线中,并协同监视流水线的执行情况。为了缓解基于触发器的流水线固有的完全同步操作模式对SET检测能力的限制,我们首先提出使用路径补偿技术来解决该限制。此外,采用了基于重用的设计范例,以减少实现的复杂性和面积开销。 AUDITOR具有强大的检测能力和较短的检测等待时间,其代价分别是面积和功耗分别增加了约29%和50%。

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