Characterization of cadmium selenide thin films by electodeposition and its holographic study

摘要

In this paper, we present the characterization of cadmium selenide thin films by electrodeposition method. We employ various depositions times for different concentrations of solutions. The structural, optical, surface morphological and surface wettability properties of the deposited films have been studied by X-ray diffraction (XRD), optical absorption, scanning electron microscope (SEM) and contact angle measurement respectively. We report a technique, which uses double exposure holographic interferometry (DEHI) technique together with simple mathematical interpretation which immediately locate thickness of thin films, mass deposited, stress to substrate and fringe width for various depositions times with different concentrations of solutions.