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Effect of Gate Engineering and Channel Length Variation in Surrounding Gate MOSFETs

机译:栅极工程和通道长度变化在周围栅极MOSFET中的影响

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摘要

In this paper, the digital and analog performance for Double Material Gate Surrounding Gate Metal Oxide Semiconductor Field Effect Transistor (DM SG MOSFET) has been analyzed. A detailed study of DM SG MOSFET is performed for different channel length ratio's. The comparison analysis on surface potential, electric field, transfer characteristics, output characteristics, transconductance and output conductance is carried with respect to the silicon dioxide and hafnium dioxide based device. It has been found from the simulation results that HfO2 dielectric used DM SG TFET provides better performance than SiO2 dielectric used DM SG TFET. Also it has been observed from the presented results that the transconductance is 45.32 at 1:3 channel length ratio for DG SG MOSFET.
机译:本文分析了围绕栅极金属氧化物半导体场效应晶体管(DM SG MOSFET)的双重材料栅极的数字和模拟性能。对DM SG MOSFET进行详细研究,对不同的信道长度比进行。相对于二氧化硅和基于二氧化铪的装置承载了表面电位,电场,传递特性,输出特性,跨导和输出电导的比较分析。从模拟结果中发现了HFO2电介质使用的DM SG TFET提供比SiO2电介质使用的DM SG TFET提供更好的性能。此外,已经从所呈现的结果观察到的,即DG SG MOSFET的跨导是在1:3通道长度的45.32处的45.32。

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