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机译:22 nm节点静态随机存取存储单元的源掩模优化和自由形式照明的实验验证
Imec vzw Kapeldreef 75 3001 Leuven, Belgium;
Imec vzw Kapeldreef 75 3001 Leuven, Belgium;
Imec vzw Kapeldreef 75 3001 Leuven, Belgium;
Imec vzw Kapeldreef 75 3001 Leuven, Belgium;
Imec vzw Kapeldreef 75 3001 Leuven, Belgium;
Imec vzw Kapeldreef 75 3001 Leuven, Belgium;
Imec vzw Kapeldreef 75 3001 Leuven, Belgium;
ASML-BRION 4210 Burton Drive Santa Clara, California 95054 ASML De Run 6501 5504 DR Veldhoven, The Netherlands;
ASML-BRION 4210 Burton Drive Santa Clara, California 95054;
ASML-BRION 4210 Burton Drive Santa Clara, California 95054;
ASML-BRION 4210 Burton Drive Santa Clara, California 95054;
ASML De Run 6501 5504 DR Veldhoven, The Netherlands;
ASML De Run 6501 5504 DR Veldhoven, The Netherlands;
ASML De Run 6501 5504 DR Veldhoven, The Netherlands;
Carl Zeiss SMT AG 73446 Oberkochen, Germany;
Carl Zeiss SMT AG 73446 Oberkochen, Germany;
Carl Zeiss SMT AG 73446 Oberkochen, Germany;
source mask co-optimization; flexray; source mask optimization; freeform illumination; static random access memory; negative tone development;
机译:22 nm节点静态随机存取存储单元的源掩模优化和自由形式照明的实验验证
机译:基于Sub-1-V-60nm垂直体沟道MOSFET的六晶体管静态随机存取存储阵列,具有宽的噪声容限和出色的功率延迟乘积,并且通过静态随机存取存储单元的单元比对其进行了优化
机译:通过智能设置/重置脉冲形状优化和验证方案,增强耐久性和50 nm世代基于HfO_2的电阻随机存取存储单元的高速设置/重置
机译:自由形式的照明光源:针对22 nm SRAM单元的源掩模优化的实验研究
机译:静态随机存取存储器中多个细胞不适的模式识别:实验测试结果与单事件不适机制的相关性。
机译:静态随机存取存储器物理不可克隆函数中最强单元的陷阱
机译:基于硅纳米线晶体管的4T静态随机存取存储单元的电阻负载优化
机译:sEU(单事件翻转)容忍存储器单元源自sRam中的sEU机制的基础研究(静态随机存取存储器)