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首页> 外文期刊>Journal of materials science >High dielectric permittivity and low loss of SrBi_4Ti_4O_(15) with PbO and V_2O_5 additions for RF and microwave applications
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High dielectric permittivity and low loss of SrBi_4Ti_4O_(15) with PbO and V_2O_5 additions for RF and microwave applications

机译:射频和微波应用中添加PbO和V_2O_5的SrBi_4Ti_4O_(15)具有高介电常数和低损耗

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摘要

In this paper SrBi_4Ti_4O_(15) (SBTi), a perovskite-type ceramic, with cation deficit A_5B_4O(15), was prepared by solid-state reaction method and PbO and V_2O_5 were added into SBTi (2, 5, 10 and 15 wt%). Samples were characterized through X-Ray Diffraction (XRD), Raman Spectroscopy and Scanning Electron Microscopy (SEM). Impedance Spectroscopy was carried out at room temperature. The analysis by XRD using the Rietveld refinement has confirmed the formation of single-phase compound with a crystalline tetragonal system (a = 3.8408 A, b = 3.8408 A and c = 41.0959 A). A SEM shows globular grains (with addition of PbO) and crystal-shape ones (with additions of V_2O_5), from about 1 to 2 μm. The dielectric properties: dielectric permittivity (k') and dielectric loss (tan δ) were measured at room temperature over a range of 100 Hz-40 MHz by complex impedance spectroscopy and in the microwave (MW) frequency region were studied. The study showed that these properties are strongly dependent on frequency and on the added level of the impurity. All the samples were analyzed taking into account to possible applications in radio frequency (RF) and MW devices.
机译:本文通过固相反应法制备了具有阳离子缺陷A_5B_4O(15)的钙钛矿型钙钛矿型陶瓷SrBi_4Ti_4O_(15),并将PbO和V_2O_5添加到SBTi(2、5、10和15 wt。 %)。通过X射线衍射(XRD),拉曼光谱和扫描电子显微镜(SEM)对样品进行表征。阻抗谱在室温下进行。使用Rietveld精炼的XRD分析已确认形成了具有晶体四方晶系的单相化合物(a = 3.8408 A,b = 3.8408 A,c = 41.0959 A)。 SEM显示球形颗粒(添加PbO)和晶体形状的颗粒(添加V_2O_5)约为1至2μm。介电性能:介电常数(k')和介电损耗(tanδ)是在室温下通过复阻抗谱在100 Hz-40 MHz范围内测量的,并在微波(MW)频率范围内进行了研究。研究表明,这些性质在很大程度上取决于频率和杂质的添加量。考虑到可能在射频(RF)和MW设备中的应用,对所有样品进行了分析。

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  • 来源
    《Journal of materials science》 |2013年第9期|3467-3473|共7页
  • 作者单位

    Departamento de Engenharia de Teleinformatica, Centro de Tecnologia, Universidade Federal do Ceara, Fortaleza, Ceara CEP: 60455-760, Brazil,Laboratorio de Telecomunicacoes e Ciencia e Engenharia de Materials (LOCEM), Universidade Federal do Ceara, Fortaleza, Ceara CEP: 60455-760, Brazil;

    Departamento de Engenharia de Teleinformatica, Centro de Tecnologia, Universidade Federal do Ceara, Fortaleza, Ceara CEP: 60455-760, Brazil,Laboratorio de Telecomunicacoes e Ciencia e Engenharia de Materials (LOCEM), Universidade Federal do Ceara, Fortaleza, Ceara CEP: 60455-760, Brazil;

    Departamento de Engenharia de Teleinformatica, Centro de Tecnologia, Universidade Federal do Ceara, Fortaleza, Ceara CEP: 60455-760, Brazil,Laboratorio de Telecomunicacoes e Ciencia e Engenharia de Materials (LOCEM), Universidade Federal do Ceara, Fortaleza, Ceara CEP: 60455-760, Brazil;

    Laboratorio de Telecomunicacoes e Ciencia e Engenharia de Materials (LOCEM), Universidade Federal do Ceara, Fortaleza, Ceara CEP: 60455-760, Brazil;

    Institute de Aeronautica e Espaco IAE, Praca Marechal Eduardo Gomes, 50, Vila das Acacias, Sao Jose dos Campos, Sao Paulo CEP 12228-904, Brazil;

    Laboratorio de Telecomunicacoes e Ciencia e Engenharia de Materials (LOCEM), Universidade Federal do Ceara, Fortaleza, Ceara CEP: 60455-760, Brazil;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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