首页> 外文期刊>Journal of materials science >Influence of cerium oxide (CeO_2) nanoparticles on the microstructure and hardness of tin-silver-copper (Sn-Ag-Cu) solders on silver (Ag) surface-finished copper (Cu) substrates
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Influence of cerium oxide (CeO_2) nanoparticles on the microstructure and hardness of tin-silver-copper (Sn-Ag-Cu) solders on silver (Ag) surface-finished copper (Cu) substrates

机译:氧化铈(CeO_2)纳米粒子对在银(Ag)表面处理的铜(Cu)基底上的锡银铜(Sn-Ag-Cu)焊料的显微结构和硬度的影响

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摘要

Nano-sized, non-reacting, non-coarsening CeO_2 particles with a density close to that of solder alloy were incorporated into Sn-3.0 wt%Ag-0.5 wt%Cu solder paste. The interfacial microstructure and hardness of Ag surface-finished Cu substrates were investigated, as a function of reaction time, at various temperatures. After the initial reaction, an island-shaped Cu_6Sn_5 intermetallic compound (IMC) layer was clearly observed at the interfaces of the Sn-Ag-Cu based solders/immersion Ag plated Cu substrates. However, after a prolonged reaction, a very thin, firmly adhering Cu_3Sn IMC layer was observed between the Cu_6Sn_5 IMC layer and the substrates. Rod-like Ag_3Sn IMC particles were also clearly observed at the interfaces. At the interfaces of the Sn-Ag-Cu based solder-Ag/Ni metallized Cu substrates, a (Cu, Ni)-Sn IMC layer was found. Rod-like Ag_3Sn and needle-shaped Cu_6Sn_5 IMC particles were also observed on the top surface of the (Cu, Ni)-Sn IMC layer. As the temperature and reaction time increased, so did the thickness of the IMC layers. In the solder ball region of both systems, a fine microstructure of Ag_3Sn, Cu_6Sn_5 IMC particles appeared in the β-Sn matrix. However, the growth behavior of the IMC layers of composite solder doped with CeO_2 nanoparticles was inhibited, due to an accumulation of surface-active CeO_2 nanoparticles at the grain boundary or in the IMC layers. In addition, the composite solder joint doped with CeO_2 nanoparticles had a higher hardness value than the plain Sn-Ag-Cu solder joints, due to a well-controlled fine microstructure and uniformly distributed CeO_2 nanoparticles. After 5 min of reaction on immersion Ag-plated Cu substrates at 250 ℃, the micro-hardness values of the plain Sn-Ag-Cu solder joint and the composite solder joints containing 1 wt% of CeO_2 nanoparticles were approximately 16.6 and 18.6 Hv, respectively. However after 30 min of reaction, the hardness values were approximately 14.4 and 16.6 Hv, while the micro-hardness values of the plain Sn-Ag-Cu solder joints and the composite solder joints on Ag/Ni metallized Cu substrates after 5 min of reaction at 250 ℃ were approximately 15.9 and 17.4 Hv, respectively. After 30 min of reaction, values of approximately 14.4 and 15.5 Hv were recorded.
机译:将密度接近焊料合金密度的纳米尺寸,不反应,不粗化的CeO_2颗粒掺入Sn-3.0 wt%Ag-0.5 wt%Cu焊膏中。研究了在不同温度下,Ag表面处理的Cu基体的界面微观结构和硬度随反应时间的变化。初始反应后,在Sn-Ag-Cu基焊料/浸有Ag的Cu基板的界面上清楚地观察到岛状的Cu_6Sn_5金属间化合物(IMC)层。但是,经过长时间的反应后,在Cu_6Sn_5 IMC层和基板之间观察到非常薄且牢固粘附的Cu_3Sn IMC层。在界面处也清楚地观察到棒状的Ag_3Sn IMC颗粒。在Sn-Ag-Cu基焊料-Ag / Ni金属化Cu基板的界面处,发现了(Cu,Ni)-Sn IMC层。在(Cu,Ni)-Sn IMC层的顶面上还观察到棒状Ag_3Sn和针状Cu_6Sn_5 IMC颗粒。随着温度和反应时间的增加,IMC层的厚度也增加。在两个系统的焊球区域中,β-Sn基质中均出现了Ag_3Sn,Cu_6Sn_5 IMC微粒的精细微观结构。然而,由于表面活性的CeO_2纳米颗粒在晶界或在IMC层中的积累,抑制了掺杂CeO_2纳米颗粒的复合焊料的IMC层的生长行为。此外,由于良好的精细组织和均匀分布的CeO_2纳米粒子,掺杂CeO_2纳米粒子的复合焊料接头的硬度值高于普通的Sn-Ag-Cu焊料接头。在250℃下于浸有Ag的镀铜基板上反应5分钟后,纯Sn-Ag-Cu焊点和含1 wt%CeO_2纳米颗粒的复合焊点的显微硬度值分别约为16.6和18.6 Hv,分别。然而,反应30分钟后,硬度值分别约为14.4和16.6 Hv,而反应5分钟后,Ag / Ni金属化Cu基体上的纯锡-银-铜焊料接头和复合焊料接头的显微硬度值在250℃下分别约为15.9 Hv和17.4 Hv。反应30分钟后,记录到约14.4和15.5Hv的值。

著录项

  • 来源
    《Journal of materials science》 |2014年第12期|5375-5387|共13页
  • 作者单位

    Department of Electronic Engineering, EPA Centre, City University of Hong Kong, 83 Tat Chee Ave., Kowloon, Hong Kong;

    Department of Electronic Engineering, EPA Centre, City University of Hong Kong, 83 Tat Chee Ave., Kowloon, Hong Kong;

    Chartermate Electronics Ltd., 5/F, 28-36 Kwai Fung Crescent, Kwai Chung, Hong Kong;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-17 13:46:18

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