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Structural characterization of CdSe/ZnS core-shell quantum dots (QDs) using TEM/STEM observation

机译:TEM / STEM观察CdSe / ZnS核壳量子点(QDs)的结构表征

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摘要

CdSe/ZnS core-shell structured nano-crystal quantum dots (QDs) are ideal candidates for light-emission applications due to their high quantum efficiency, narrowband, and particle-size-tunable photoluminescence. In particular, their small size results in the quantum confinement of semiconductor nano-crystals, which widens their energy gaps. In general, structural analyses of QDs using a transmission electron microscope (TEM) are very important due to the significantly small size of QDs. We were able to obtain structural information of CdSe/ZnS core-shell QDs using nano-beam diffraction by controlling the nano-probe of the dark field scanning TEM (DF-STEM) mode and strain analysis with high-resolution TEM (HRTEM)/STEM images. Furthermore, we could clearly distinguish the interface between the CdSe core and the ZnS shell from the strain analysis with the HRTEM/STEM images.
机译:CdSe / ZnS核壳结构的纳米晶体量子点(QDs)由于其高量子效率,窄带和粒径可调的光致发光而成为发光应用的理想候选者。特别地,它们的小尺寸导致半导体纳米晶体的量子限制,这扩大了它们的能隙。通常,由于量子点的尺寸非常小,因此使用透射电子显微镜(TEM)对量子点进行结构分析非常重要。通过控制暗场扫描TEM(DF-STEM)模式的纳米探针和高分辨率TEM(HRTEM)/应变分析,我们能够使用纳米束衍射获得CdSe / ZnS核壳量子点的结构信息。 STEM图片。此外,通过HRTEM / STEM图像的应变分析,我们可以清楚地区分CdSe核与ZnS壳之间的界面。

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  • 来源
    《Journal of materials science》 |2014年第5期|2047-2052|共6页
  • 作者单位

    Materials Characterization Team, Materials and Components Laboratory, LG Electronics Advanced Research Institute, 38 Baumoe-ro, Seocho-gu, Seoul 137-724, South Korea;

    New Device Team, LG Electronics Advanced Research Institute, 38 Baumoe-ro, Seocho-gu, Seoul 137-724, South Korea;

    Materials Characterization Team, Materials and Components Laboratory, LG Electronics Advanced Research Institute, 38 Baumoe-ro, Seocho-gu, Seoul 137-724, South Korea;

    Materials Characterization Team, Materials and Components Laboratory, LG Electronics Advanced Research Institute, 38 Baumoe-ro, Seocho-gu, Seoul 137-724, South Korea;

    Materials Characterization Team, Materials and Components Laboratory, LG Electronics Advanced Research Institute, 38 Baumoe-ro, Seocho-gu, Seoul 137-724, South Korea;

    Materials Characterization Team, Materials and Components Laboratory, LG Electronics Advanced Research Institute, 38 Baumoe-ro, Seocho-gu, Seoul 137-724, South Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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