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首页> 外文期刊>Journal of materials science >Heat treatments in chemically deposited SnS thin films and their influence in CdS/SnS photovoltaic structures
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Heat treatments in chemically deposited SnS thin films and their influence in CdS/SnS photovoltaic structures

机译:化学沉积SnS薄膜的热处理及其对CdS / SnS光伏结构的影响

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摘要

Chemical deposition technique is used to produce good quality tin sulphide (SnS) thin films of 450 nm in thickness, from a chemical bath containing tin chloride (SnCl_2·2H_2O) and thioacetamide. The SnS thin films were annealed at 300, 350 and 400 ℃ for 1 h in vacuum, nitrogen and argon atmospheres, resulting in the modification of their optical and electrical properties. The optical band gap showed a decrease from 1.2 to 1 eV whereas the electrical conductivity increased by more than two orders in the heat treated films at 400 ℃ in comparison with those of pristine samples. The morphology analysis of the as prepared and heat treated SnS thin films was done using scanning electron microscopy; X-ray diffraction patterns showed orthorhombic SnS phase and the chemical states of the elements were confirmed by X-ray photoelectron spectroscopy. The heat treated SnS thin films (1.8 μm thickness) were incorporated to photovoltaic structures of the type: Glass/TCO/CdS/SnS/C/Ag, showing open circuit voltages (V_(oc)) from 270 to 330 mV and a short circuit current density (J_(sc)) up to 6 mA/cm~2.
机译:化学沉积技术用于从包含氯化锡(SnCl_2·2H_2O)和硫代乙酰胺的化学浴中生产厚度为450 nm的高质量硫化锡(SnS)薄膜。 SnS薄膜在真空,氮气和氩气气氛中分别于300、350和400℃退火1 h,从而改变了它们的光学和电学性质。与原始样品相比,在400℃热处理后的薄膜中,光学带隙从1.2 eV减小,而电导率增加了两个以上。使用扫描电子显微镜对所制备和热处理的SnS薄膜进行形态分析。 X射线衍射图显示出正交SnS相,并且通过X射线光电子能谱确认了元素的化学状态。将经过热处理的SnS薄膜(厚度为1.8μm)并入以下类型的光伏结构中:玻璃/ TCO / CdS / SnS / C / Ag,其开路电压(V_(oc))为270至330 mV,短路电路电流密度(J_(sc))高达6 mA / cm〜2。

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  • 来源
    《Journal of materials science》 |2015年第8期|5585-5592|共8页
  • 作者单位

    Facultad de Ingenieria Mecanica y Electrica, Universidad Autonoma de Nuevo Leon, C.P. 66450 San Nicolas de los Garza, Nuevo Leon, Mexico;

    Facultad de Ingenieria Mecanica y Electrica, Universidad Autonoma de Nuevo Leon, C.P. 66450 San Nicolas de los Garza, Nuevo Leon, Mexico,CIIDIT- Universidad Autonoma de Nuevo Leon, Apodaca, Nuevo Leon, Mexico;

    Facultad de Ingenieria Mecanica y Electrica, Universidad Autonoma de Nuevo Leon, C.P. 66450 San Nicolas de los Garza, Nuevo Leon, Mexico;

    Facultad de Ingenieria Mecanica y Electrica, Universidad Autonoma de Nuevo Leon, C.P. 66450 San Nicolas de los Garza, Nuevo Leon, Mexico;

    Facultad de Ingenieria Mecanica y Electrica, Universidad Autonoma de Nuevo Leon, C.P. 66450 San Nicolas de los Garza, Nuevo Leon, Mexico,CIIDIT- Universidad Autonoma de Nuevo Leon, Apodaca, Nuevo Leon, Mexico;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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