Characteristics of pulse electrodeposited CuAlSe_2 films

摘要

CuAlSe_2 films were pulse electrodeposited on tin oxide coated glass substrates at different duty cycles for the first time. X-ray diffraction studies indicated single phase chalcopyrite CuAlSe_2. Strain, crystallite size and dislocation density were evaluated from the X-ray diffraction data. The Cu/Al ratio approaches unity at higher duty cycles. Electrical transport properties of the films indicated that the resistivity of the films decreased with increase of duty cycle. Photoelectrochemical cells were fabricated with the films deposited at different duty cycles. Films deposited at 50 % duty cycle indicated high photo output. Capacitance voltage measurements were made and the nature of the plot indicated p-type behaviour.