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Saturated hysteresis loops and conduction mechanisms in Mn-doped BiFeO_3 thin films derived from sol-gel process

机译:溶胶-凝胶法制备的Mn掺杂BiFeO_3薄膜的饱和磁滞回线和导电机理

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摘要

Mn-doped BiFeO_3 (BFO) thin films with nominal composition of BiFe_(1-x)Mn_xO_3 (x = 0.00, 0.01, 0.03, 0.05, 0.07) were deposited on (111)Pt/Ti/SiO_2/Si substrates via a simple sol-gel spin-coating method with rapid thermal annealing process. The BFO films with different Mn dopant contents were well crystallized in the perovskite structure and their overlapped (110) diffraction peaks shifted toward higher angles with the increase in Mn content, indicating a slight distortion in the lattice structure. Improved microstructure with smaller grain size and diminished structural defects can be observed in the films of × around 0.03. X-ray photoelectron spectroscopy analysis confirmed the coexistence of 2+ and 3+ electronic states for Fe element and proper substitution of Mn for Fe can decrease the amount of Fe~(2+) while excess doping results in increasing Fe~(2+) content. The intrinsic ferroelectric polarization was hard to be measured in the pure BFO film due to high leakage contribution, whereas the x = 0.03, 0.05 and 0.07 films exhibited well-saturated rectangular shape-like ferroelectric hysteresis loops, and more importantly, perfectly closed hysteresis loops were obtained for the x = 0.03 film with a 2Pr value of 85.2 μC/cm~2. The leakage current density in high electric field region was dramatically decreased by Mn doping, e.g. decreased to 3.3 × 10~(-4) A/cm~2 at electric filed intensity of 170 kV/cm for the x = 0.03 film. Detailed leakage current characteristic analysis suggested that the dominant conduction mechanism in the pure BFO film was the space charge limited conduction at medium/high electric fields, which was associated with the space charges originated by oxygen vacancies; however, the leakage current of the x = 0.03 film was dominated by the Schottky mechanism in medium/high electric field region.
机译:通过简单的方法在(111)Pt / Ti / SiO_2 / Si衬底上沉积标称成分为BiFe_(1-x)Mn_xO_3(x = 0.00、0.01、0.03、0.05、0.07)的Mn掺杂BiFeO_3(BFO)薄膜。采用快速热退火工艺的溶胶-凝胶旋涂方法。 Mn掺杂含量不同的BFO膜在钙钛矿结构中结晶良好,随着Mn含量的增加,其重叠的(110)衍射峰向较高的角度偏移,表明晶格结构略有变形。在×约为0.03的薄膜中,可以观察到具有较小晶粒尺寸的改善的微观结构和结构缺陷的减少。 X射线光电子能谱分析证实了Fe元素同时存在2+和3+电子态,适当地用Mn代替Fe可以减少Fe〜(2+)的含量,而过量掺杂会导致Fe〜(2+)的增加内容。在纯BFO薄膜中,由于高漏电贡献,很难测量本征铁电极化,而x = 0.03、0.05和0.07薄膜表现出饱和度良好的矩形铁电磁滞回线,更重要的是,完美闭合的磁滞回线对于x = 0.03的薄膜,其2Pr值为85.2μC/ cm〜2。高电场区域中的漏电流密度通过Mn掺杂(例如,Mn)显着降低。对于x = 0.03的膜,在170kV / cm的电场强度下降低至3.3×10 4(-4)A / cm 2。详细的泄漏电流特性分析表明,纯BFO膜的主要传导机制是中/高电场下空间电荷受限的传导,这与氧空位产生的空间电荷有关。然而,在中/高电场区域,x = 0.03薄膜的泄漏电流受肖特基机理控制。

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  • 来源
    《Journal of materials science》 |2015年第3期|1719-1726|共8页
  • 作者单位

    Department of Materials Science, Sichuan University, Chengdu 610064, China;

    Department of Materials Science, Sichuan University, Chengdu 610064, China;

    Department of Materials Science, Sichuan University, Chengdu 610064, China;

    Department of Materials Science, Sichuan University, Chengdu 610064, China;

    Department of Materials Science, Sichuan University, Chengdu 610064, China;

    Department of Materials Science, Sichuan University, Chengdu 610064, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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