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首页> 外文期刊>Journal of materials science >Nanocrystalline Ni_(0.70-x)Cu_xZn_(0.30)Fe_2O_4 with 0≤x≤0.25 prepared by nitrate-citrate route: structure, morphology and electrical investigations
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Nanocrystalline Ni_(0.70-x)Cu_xZn_(0.30)Fe_2O_4 with 0≤x≤0.25 prepared by nitrate-citrate route: structure, morphology and electrical investigations

机译:硝酸盐柠檬酸盐法制备0≤x≤0.25的纳米晶Ni_(0.70-x)Cu_xZn_(0.30)Fe_2O_4:结构,形貌和电学研究

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摘要

AbstractThe structure, morphology, temperature dependent electrical and frequency dependent dielectric behavior of Cu2+substituted Ni–Zn spinel ferrite nanoparticles having generic formula Ni0.70−xCuxZn0.30Fe2O4(x = 0.00, 0.05, 0.15 and 0.25) prepared by sol–gel auto combustion technique with citric acid as a chelating agent is reported here. The XRD patterns revealed the presence of cubic spinel structure. The crystallite size was obtained using Scherrer’s formula which varies between 29 and 34 nm. The lattice parameter was found to increase with an increase in copper concentration. FTIR spectra show the characteristic bands for tetrahedral and octahedral sites. The morphology investigated by SEM technique demonstrates the nanocrystalline grain formation with almost spherical geometry. The grain size obtained from SEM analysis is in the range of 69–88 nm. The particle size obtained through TEM image analysis varies from 30 to 35 nm. The electrical and dielectric behavior was studied using a two-probe technique as a function of temperature and frequency respectively. Various electrical parameters like DC resistivity, activation energy, drift mobility, charge carrier concentration, diffusion coefficient were obtained as a function of copper concentration ‘x’. Arrhenius plot indicates the semiconducting nature of Cu2+substituted Ni–Zn spinel ferrite. The dielectric constant and dielectric loss tangent both decreases with increase in frequency and concentration of Cu2+.
机译: 摘要 Cu 2+ <的结构,形态,温度相关的电学和频率相关的介电行为/上标>通式Ni 0.70−x Cu x Zn 0.30 Fe 2 O 4 (x = 0.00、0.05、0.15和0.25)。 XRD图谱表明存在立方尖晶石结构。使用Scherrer公式获得的微晶尺寸在29至34 nm之间变化。发现晶格参数随铜浓度的增加而增加。 FTIR光谱显示四面体和八面体位点的特征谱带。通过SEM技术研究的形态显示出具有几乎球形几何形状的纳米晶粒形成。通过SEM分析获得的晶粒尺寸在69-88 nm之间。通过TEM图像分析获得的粒径从30到35 nm不等。使用双探针技术分别研究了电性能和电介质性能与温度和频率的关系。获得了各种电参数,例如直流电阻率,活化能,漂移迁移率,电荷载流子浓度,扩散系数,它们是铜浓度“ x”的函数。 Arrhenius图表明Cu 2 + 取代的Ni-Zn尖晶石铁素体的半导体性质。随Cu 2 + 的频率和浓度的增加,介电常数和介电损耗角正切均减小。

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  • 来源
    《Journal of materials science》 |2018年第4期|3467-3481|共15页
  • 作者单位

    Department of Physics, Dr. Babasaheb Ambedkar Marathwada University;

    Department of Physics, Dr. Babasaheb Ambedkar Marathwada University;

    Department of Physics, Vivekanand Arts, Sardar Dalipsingh Commerce and Science College;

    Department of Physics, Dr. Babasaheb Ambedkar Marathwada University;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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