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首页> 外文期刊>Journal of Materials Research >Synthesis of oriented BiFeO3 thin films by chemical solution deposition: Phase, texture, and microstructural development
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Synthesis of oriented BiFeO3 thin films by chemical solution deposition: Phase, texture, and microstructural development

机译:通过化学溶液沉积合成取向的BiFeO3薄膜:相,织构和微结构发展

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摘要

Textured, thin films of BiFeO3 (similar to 120 nm thickness) were synthesized by chemical solution deposition from a mixture of iron- and bismuth-2-methoxyethoxides on Si(100)/SiO2/TiO2/Pt substrates. The use of alkoxides ensured good homogeneity and a low degree of organics that further facilitated low crystallization temperatures. Crystalline films were according to x-ray diffraction already obtained at 480 degrees C. Precursor characteristics were investigated using thermogravimetry and differential scanning calorimetry, whereas phase purity, microstructure and film topography were examined by x-ray diffraction, transmission electron microscopy, atomic force microscopy, and x-ray photoelectron spectroscopy. A small (10%) Bi excess was found necessary to obtain dense, pore-free films. Such additions also prevented decomposition of BiFeO3 at high temperatures. The observed (012) texture is believed to originate from the growth mechanism as no relation to the substrate is found. This is also confirmed by observing (012) texture for films on glass substrates.
机译:通过在Si(100)/ SiO2 / TiO2 / Pt衬底上由铁和铋-2-甲氧基乙醇的混合物进行化学溶液沉积来合成带纹理的BiFeO3薄膜(类似于120 nm厚度)。醇盐的使用确保了良好的均质性和较低的有机物含量,这进一步促进了较低的结晶温度。根据在480摄氏度时已经获得的x射线衍射对结晶膜进行分析。使用热重分析和差示扫描量热法研究了前体的特征,而通过x射线衍射,透射电子显微镜,原子力显微镜检查了相纯度,微观结构和膜形貌,以及X射线光电子能谱。发现少量(10%)Bi过量对于获得致密,无孔的薄膜是必要的。这样的添加还防止了BiFeO 3在高温下的分解。认为观察到的(012)织构源自生长机理,因为未发现与基材的关系。通过观察(012)玻璃基板上的膜的织构也可以确认这一点。

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