机译:纳米级硅自支撑梁的片上拉伸测试
Research Center in Micro and Nanoscopic Materials and Electronic Devices, Universite Catholique de Louvain,B-1348 Louvain-la-Neuve, Belgium Institute of Information and Communication Technologies, Electronics and Applied Mathematics, Universite Catholique de Louvain, B-1348 Louvain-la-Neuve, Belgium;
Research Center in Micro and Nanoscopic Materials and Electronic Devices, Universite Catholique de Louvain,B-1348 Louvain-la-Neuve, Belgium Institute of Information and Communication Technologies, Electronics and Applied Mathematics, Universite Catholique de Louvain, B-1348 Louvain-la-Neuve, Belgium;
Research Center in Micro and Nanoscopic Materials and Electronic Devices, Universite Catholique de Louvain,B-1348 Louvain-la-Neuve, Belgium Institute of Information and Communication Technologies, Electronics and Applied Mathematics, Universite Catholique de Louvain, B-1348 Louvain-la-Neuve, Belgium;
Newcastle University, School of Electrical, Electronic & Computer Engineering, NE1 7RU, Newcastle upon Tyne,United Kingdom;
Newcastle University, School of Electrical, Electronic & Computer Engineering, NE1 7RU, Newcastle upon Tyne,United Kingdom;
Institute of Mechanics, Materials and Civil Engineering, Universite Catholique de Louvain,B-1348 Louvain-la-Neuve, Belgium Research Center in Micro and Nanoscopic Materials and Electronic Devices,Universite Catholique de Louvain, B-1348 Louvain-la-Neuve, Belgium;
Research Center in Micro and Nanoscopic Materials and Electronic Devices, Universite Catholique de Louvain,B-1348 Louvain-la-Neuve, Belgium Institute of Information and Communication Technologies, Electronics and Applied Mathematics, Universite Catholique de Louvain, B-1348 Louvain-la-Neuve, Belgium;
机译:独立式SiO2梁上锗微盘的拉伸应变工程
机译:自由应变薄膜在高应变速率下单轴拉伸测试的新方法
机译:室温下拉伸试验中自支撑的Pt-铝化物粘合涂层的失效机理
机译:纳米级硅防独立梁机械和电力性能的片上拉伸试验
机译:通过噪声感知测试和芯片调试来解决纳米级IC故障。
机译:通过片上测试对多晶硅膜的力学和几何特性进行统计研究
机译:自支撑siO2梁上锗微盘的拉伸应变工程