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Optical polishing process: Analysis and optimization using response surface methodology (RSM) for large diameter fused silica flat substrates

机译:光学抛光工艺:使用响应表面方法(RSM)对大直径熔融石英平板基板进行分析和优化

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摘要

The skill dependent optical polishing process remains elusive due to unaccounted parameters and uncertainties. Deterministic relations for surface quality of polished optics have been developed in this paper by analysis and optimization of three significant input parameters: abrasive concentration, relative velocity and abrasive size. Average roughness value (Ra), measured on a surface profilometer: Talysurf PGI-120, indicated the response. MALVERN ZETASIZER was used to measure average size of abrasives using Dynamic Light Scattering principle. The parameter values have been computed in standard units for general relevance across different setups, a feature absent in earlier studies. Flat Fused Silica glass samples of 100 mm diameter were polished for two hours on a conventional single arm spindle polisher with a polyurethane pad using Ceria slurry. Central Composite Design (CCD) of RSM was used for fitting a second order model. Kinematic analysis established the polishing spindle and sample rotation speeds to be equal for uniform velocity distribution. Relative velocity was the most significant input, followed by concentration. Surface and contour plots resulted in a domain of peak performance. Optimum combination (velocity 1054.8 mm/s, abrasive size 8.5 nm, concentration 2.45%) identified using desirability approach based on the second order regression model resulted in Ra value as low as 5.7 nm, well within permissible error limits from the predicted value. (C) 2017 The Society of Manufacturing Engineers. Published by Elsevier Ltd. All rights reserved.
机译:由于不确定的参数和不确定性,取决于技术的光学抛光工艺仍然难以捉摸。通过分析和优化三个重要的输入参数:磨料浓度,相对速度和磨料尺寸,建立了抛光光学器件表面质量的确定性关系。在表面轮廓仪:Talysurf PGI-120上测量的平均粗糙度值(Ra)表示响应。使用动态光散射原理,MALVERN ZETASIZER用于测量磨料的平均尺寸。参数值已针对不同设置之间的一般相关性以标准单位进行计算,这是早期研究中所没有的功能。使用Ceria浆料在带有聚氨酯垫的常规单臂锭子抛光机上将100 mm直径的扁平熔融石英玻璃样品抛光两个小时。 RSM的中央复合设计(CCD)用于拟合二阶模型。运动学分析确定抛光主轴和样品的转速相等,以获得均匀的速度分布。相对速度是最重要的输入,其次是注意力。表面和等高线图导致了峰值性能的范围。使用基于二阶回归模型的期望方法确定的最佳组合(速度1054.8 mm / s,磨料尺寸8.5 nm,浓度2.45%)导致Ra值低至5.7 nm,完全在预测值的允许误差范围内。 (C)2017年制造工程师学会。由Elsevier Ltd.出版。保留所有权利。

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