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Strain-symmetrized Si/SiGe multi-quantum well structures grown by molecular beam epitaxy for intersubband engineering

机译:用于子带间工程的分子束外延生长的应变对称Si / SiGe多量子阱结构

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Three strain-symmetrized Si/SiGe multi-quantum well structures, designed for probing the carrier lifetime of intrawell intersubband transitions between heavy hole 1 (HH1) and light hole 1 (LH1) states with transition energies below the optical phonon energy, were grown by molecular beam epitaxy at low temperature on fully relaxed SiGe virtual substrates. The grown structures were characterized by using various experimental techniques, showing a high crystalline quality and very precise growth control. The lifetime of the LH1 excited state was determined directly with pump-probe spectroscopy. The measurements indicated an increase of the lifetime by a factor of similar to 2 due to the increasingly unconfined LH1 state, which agreed very well with the design. It also showed a very long lifetime of several hundred picoseconds for the holes excited out of the well to transit back to the well through a diagonal process. (c) 2006 Elsevier B.V. All rights reserved.
机译:生长了三个应变对称的Si / SiGe多量子阱结构,用于探测重空穴1(HH1)和轻空穴1(LH1)状态之间的带内子带间跃迁的载流子寿命,其跃迁能量低于光子能量。完全弛豫的SiGe虚拟衬底上的低温分子束外延。通过使用各种实验技术来表征生长的结构,显示出高的晶体质量和非常精确的生长控制。 LH1激发态的寿命直接通过泵浦探针光谱法确定。测量结果表明,由于LH1状态越来越不受限制,使用寿命增加了大约2倍,这与设计非常吻合。它还显示出数百皮秒的超长寿命,使从井中激发出来的孔通过对角线过程过渡回到井中。 (c)2006 Elsevier B.V.保留所有权利。

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