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首页> 外文期刊>Journal of Luminescence >Effect of rapid thermal annealing on the optical properties of MBE growth GaNAs films
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Effect of rapid thermal annealing on the optical properties of MBE growth GaNAs films

机译:快速热退火对MBE生长GaNAs薄膜光学性能的影响

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We report the effect of rapid thermal annealing (RTA) on the optical properties of GaN_(0.01)As_(0.99) samples grown by molecular beam epitaxy. In particular, a blueshift of the PL peak energy is observed when annealing the samples at 650—900℃. Samples annealed showed pronounced enhancement in PL intensity as compared to the as-grown sample, and 850℃ is proposed as the optimum RTA temperature. The results are examined as a consequence of RTA-induced nitrogen diffusion inside the GaN_(0.01)As_(0.99) material rather than diffusion out of the alloy, which homogenizes initial nitrogen composition fluctuations. In addition, for photo-modulated reflectance (PR) spectra of RTA samples, the fundamental band gap transition (E_0) and the transition from the spin-orbit split-off valence band (E_0 + Δ_0) are observed. Both of the two transitions increase with increasing annealing temperature.
机译:我们报告了快速热退火(RTA)对通过分子束外延生长的GaN_(0.01)As_(0.99)样品的光学性能的影响。尤其是在650-900℃退火时,PL峰值能量会发生蓝移。退火后的样品与生长后的样品相比,PL强度显着增强,建议将850℃作为最佳RTA温度。检查结果是由于RTA引起的GaN_(0.01)As_(0.99)材料内氮扩散而不是合金外扩散,使初始氮成分波动均匀。此外,对于RTA样品的光调制反射(PR)光谱,观察到了基带隙跃迁(E_0)和自旋轨道分裂价带的跃迁(E_0 +Δ_0)。两个过渡都随退火温度的升高而增加。

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