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Room temperature photoluminescence from amorphous silicon nanoparticles in SiO_x thin films

机译:SiO_x薄膜中非晶硅纳米颗粒的室温光致发光

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Amorphous SiO_x thin films with four different oxygen contents (x = 1.15, 1.4, 1.5, and 1.7) have been prepared by thermal evaporation of SiO in vacuum and then annealed at 770 or 970 K in argon for various times ≥ 40 min. The influence of annealing conditions and the initial film composition on photoluminescence (PL) from the annealed films has been explored. Intense room temperature PL has been observed from films with x ≥ 1.5, visible with a naked eye. It has been shown that PL spectra of most samples consists of two main bands: (ⅰ) a 'green' band centered at about 2.3 eV, whose position does not change with annealing conditions and (ⅱ) an 'orange-red' band whose maximum moves from 2.1 to 1.7eV with increasing annealing time and temperature and decreasing initial oxygen content. These observations have been explained assuming recombination via defect states in the SiO_x matrix for the first band and emission from amorphous Si nanoparticles for the second one.
机译:通过在真空中热蒸发SiO来制备具有四种不同氧含量(x = 1.15、1.4、1.5和1.7)的非晶SiO_x薄膜,然后在氩气中于770或970 K退火≥40分钟。已经研究了退火条件和初始膜组成对退火膜的光致发光(PL)的影响。从肉眼可见的x≥1.5的薄膜中观察到强烈的室温PL。已显示大多数样品的PL光谱由两个主要谱带组成:(ⅰ)中心为约2.3 eV的“绿色”谱带,其位置不随退火条件而变化;(ⅱ)“橙红色”谱带,其随着退火时间和温度的增加以及初始氧含量的降低,最大电流从2.1eV移至1.7eV。这些观察结果已被解释为假设通过SiO_x矩阵中的缺陷状态对第一条带进行重组,并从非晶Si纳米粒子对第二条带进行发射。

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