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Phonon Heat Conduction in Thin Films: Impacts of Thermal Boundary Resistance and Internal Heat Generation

机译:薄膜中的声子导热:热边界电阻和内部发热的影响

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摘要

The measured thermal resistance across a thin film deposited on a substrate often in- cludes the internal thermal resistance within the film and the thermal boundary resistance (TBR) across the film-substrate interface. These two resistances are frequently lumped and reported as an equivalent thermal conductivity of the film. Two fundamental ques- tions should be answered regarding the sue of this equivalent thermal conductivity. One is whether it leads to the correct temperature distribution inside the film. The other one is wherther it is applicable for thin films with internal heat generation.
机译:在沉积在基材上的薄膜上测得的热阻通常包括薄膜内的内部热阻和在薄膜-基材界面上的热边界电阻(TBR)。这两个电阻经常会集总,并报告为薄膜的等效热导率。关于这种等效热导率的问题,应该回答两个基本问题。一种是它是否导致薄膜内部正确的温度分布。另外一种适用于内部发热的薄膜。

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