Effect of far-infrared radiation assisted drying on microstructure of banana slices: An illustrative use of X-ray microtomography in microstructural evaluation of a food product

摘要

X-ray microtomography coupled with image analysis represents a non-destructive technique, which allows scanning an entire sample to obtain such information as total pore volume and pore size distribution without the need of serial cuts as in the case of scanning electron microscopy (SEM). The technique has been applied successfully to obtain reliable microstructural information of many products undergoing different physical and chemical processes. However, the technique has still found limited use in food processing. To illustrate the use of X-ray microtomography the technique was applied to investigate the effect of far-infrared radiation (FIR) assisted drying on microstructure of a food product viz. banana. Two representative drying techniques, i.e., low-pressure superheated steam drying (LPSSD) and vacuum drying (VACUUM) were tested. Banana slices were dried by LPSSD-FIR at two different temperatures (80 and 90℃) at a fixed pressure of 7 kPa. The total pore volume and pore size distribution of dried banana slices were then determined using X-ray microtomography. The results were also compared with those of products dried by LPSSD without FIR. Far-infrared radiation was found to modify the structure of the dried bananas by increasing their final porosity. The same effect of FIR was also observed in the case of vacuum drying with FIR (VACUUM-FIR). An increase of the drying temperature was also found to globally lead to an increase in the final porosity of the products.