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机译:基于工艺差异研究的高性能RF内核设计注意事项
Department of Computer Science and Engineering University at Buffalo The State University of New York Buffalo NY 14260 USA;
Department of Electrical Engineering University at Buffalo The State University of New York Buffalo NY 14260 USA;
Department of Electrical Engineering University at Buffalo The State University of New York Buffalo NY 14260 USA;
Department of Electrical Engineering University at Buffalo The State University of New York Buffalo NY 14260 USA;
Department of Electrical Engineering University at Buffalo The State University of New York Buffalo NY 14260 USA;
Department of Electrical Engineering University at Buffalo The State University of New York Buffalo NY 14260 USA;
Department of Electrical Engineering University at Buffalo The State University of New York Buffalo NY 14260 USA;
Cascode LNA; Corner analysis; Differential CMOS LNA; Jitter; Monte Carlo analysis; Noise figure; Phase frequency detector (PFD); Phase noise; Process variation; S-parameters; Reuse topology;
机译:基于工艺差异研究的高性能RF内核设计注意事项
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