首页> 外文期刊>Journal of Electronic Packaging >Characterization of Chemical Cure Shrinkage of Epoxy Molding Compound With Application to Warpage Analysis
【24h】

Characterization of Chemical Cure Shrinkage of Epoxy Molding Compound With Application to Warpage Analysis

机译:环氧模塑料化学固化收缩率的表征及其在翘曲分析中的应用

获取原文
获取原文并翻译 | 示例
           

摘要

After encapsulation, thermomechanical deformation builds up within the electronic packages due to the temperature coefficient of expansion mismatch between the respective materials within the package as it cools to room temperature. At the same time, the chemical cure shrinkage exerts important influence on the total deformation. Due to the complexity and time consuming of the calculation, it is almost impossible for an industry to carry out the numerical simulation using viscoelastic property, which is the most close to the real material property of polymer material. However, finite element analysis (FEA) using temperature-dependent elastic property, temperature-dependent thermal expansion coefficient, and accurate chemical cure shrinkage can help to improve the accuracy on the stress and warpage prediction. This study has developed an evaluation method for the chemical cure shrinkage based on the measurement of the warpage of bimaterial model. The results show that FEA simulations without chemical cure shrinkage fail to accurately predict the package warpage. On the other hand, FEA simulations with chemical cure shrinkage are outlined, which show fair agreement with experimental measurements of package warpage over a range of temperatures. Furthermore, this study has evaluated the effect of silica filler percentage on the chemical cure shrinkage and confirmed that the chemical cure shrinkage decreases with the increase in silica filler percentage.
机译:封装后,由于电子封装内的各个材料在冷却至室温时的温度膨胀系数不匹配,因此在电子封装内会形成热机械变形。同时,化学固化收缩对总变形有重要影响。由于计算的复杂性和耗时,几乎一个行业几乎不可能使用粘弹性质来进行数值模拟,而粘弹性质最接近于聚合物材料的实际材料性质。但是,使用与温度有关的弹性特性,与温度有关的热膨胀系数和精确的化学固化收缩率的有限元分析(FEA)有助于提高应力和翘曲预测的准确性。本研究开发了一种基于双材料模型翘曲测量的化学固化收缩率评估方法。结果表明,没有化学固化收缩的FEA模拟无法准确预测封装翘曲。另一方面,概述了具有化学固化收缩率的FEA模拟,这与在一定温度范围内封装翘曲的实验测量结果十分吻合。此外,该研究评估了二氧化硅填料百分比对化学固化收缩率的影响,并证实了随着二氧化硅填料百分比的增加,化学固化收缩率降低。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号