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首页> 外文期刊>Journal of Electronic Packaging >Comparative Study of Phenolic-Based and Amine-Based Underfill Materials in Flip Chip Plastic Ball Grid Array Package
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Comparative Study of Phenolic-Based and Amine-Based Underfill Materials in Flip Chip Plastic Ball Grid Array Package

机译:倒装芯片塑料球栅阵列封装中酚基和胺基底部填充材料的比较研究

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摘要

Phenolic and amine epoxy systems are widely used as hardeners in underfill materials for flip chip packaging. A comparison was made between these two systems in order to evaluate the reliability performance of a flip chip plastic ball grid array (FC-PBGA). The coefficient of thermal expansion, glass transition temperature (T_g), Young's modulus (E), and fracture toughness were revealed by using a thermal mechanical analyzer, a dynamic mechanical analyzer, and a single-edge notch three-point bending test, while moisture absorption study was performed using an 85℃/85% relative humidity chamber. The adhesion strength with different conditions of temperature and humidity was performed using a die shear test. The series of standard reliability tests such as accelerated temperature cycle test, pressure cooker test, thermal humidity storage test, and high temperature storage test were executed upon the FC-PBGA, which was filled by phenolic and amine epoxy systems of underfill materials. It was found that the adhesion strength of phenolic-based underfills is better than that of amine-based underfills in almost all test conditions. Phenolic-based underfills also demonstrated better reliability compared with amine-based underfills.
机译:酚醛和胺基环氧体系被广泛用作倒装芯片封装的底部填充材料中的硬化剂。为了评估倒装芯片塑料球栅阵列(FC-PBGA)的可靠性能,对这两个系统进行了比较。通过使用热力学分析仪,动态力学分析仪和单边缺口三点弯曲试验,在潮湿的情况下显示了热膨胀系数,玻璃化转变温度(T_g),杨氏模量(E)和断裂韧性。吸收研究是在相对湿度为85℃/ 85%的室内进行的。使用模切试验在不同温度和湿度条件下的粘合强度。在FC-PBGA上执行了一系列标准可靠性测试,例如加速温度循环测试,压力锅测试,热湿气存储测试和高温存储测试,该测试由底部填充材料的酚醛和胺氧基体系填充。发现在几乎所有测试条件下,酚醛基底部填充胶的粘合强度均优于胺基底部填充胶。与基于胺的底部填充胶相比,基于酚的底部填充胶还具有更好的可靠性。

著录项

  • 来源
    《Journal of Electronic Packaging 》 |2010年第4期| p.041012.1-041012.6| 共6页
  • 作者单位

    Institute of Microengineering and Nanoelectronics (IMEN), Universiti Kebangsaan Malaysia (UKM), Bangi, Selangor 43600, Malaysia;

    rnInstitute of Microengineering and Nanoelectronics (IMEN), Universiti Kebangsaan Malaysia (UKM), Bangi, Selangor 43600, Malaysia;

    rnInstitute of Microengineering and Nanoelectronics (IMEN), Universiti Kebangsaan Malaysia (UKM), Bangi, Selangor 43600, Malaysia;

    rnInstitute of Microengineering and Nanoelectronics (IMEN), Universiti Kebangsaan Malaysia (UKM), Bangi, Selangor 43600, Malaysia;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    amine-based; phenolic-based; reliability; underfill;

    机译:胺基酚醛基可靠性;底部填充;

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