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首页> 外文期刊>Journal of Crystal Growth >High-power 1.3 μm InAs/GaInAs/GaAs QD lasers grown in a multiwafer MBE production system
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High-power 1.3 μm InAs/GaInAs/GaAs QD lasers grown in a multiwafer MBE production system

机译:在多晶片MBE生产系统中生长的高功率1.3μmInAs / GaInAs / GaAs QD激光器

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摘要

High-performance (high optical output power, high efficiency), GaAs-based Quantum Dots (QD) 1.3 μm edge emitting laser (EEL) results are presented. The active region is based on multiple stacks of InAs/GaInAs/GaAs QD. The whole structure has been grown in a multiwafer production MBE system (using 5 x 3″ substrate holders). Threshold current density of 190 A/cm~2 and high differential quantum efficiency of 70% were obtained at room temperature. These excellent values in addition to good I-V characteristics (1.1 V turn on voltage and series resistance as low as 2 x 10~(-4) Ω cm~2) led to record continuous wave (CW) output power of 4.2 W for broad area devices (100 μm wide, 1600 μm long).
机译:提出了基于GaAs的高性能(高光输出功率,高效率)量子点(QD)1.3μm边缘发射激光器(EEL)的结果。有源区基于InAs / GaInAs / GaAs QD的多个堆栈。整个结构已在多晶片生产MBE系统中生长(使用5 x 3英寸基板支架)。在室温下获得了190 A / cm〜2的阈值电流密度和70%的高差分量子效率。这些出色的值以及良好的IV特性(1.1 V的开启电压和低至2 x 10〜(-4)Ωcm〜2的串联电阻)导致大面积记录的4.2 W连续波(CW)输出功率器件(宽100μm,长1600μm)。

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