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首页> 外文期刊>Journal of Crystal Growth >Gas source MBE growth and characterization of TlInGaP and TlGaAskkkk layers for ling wavelength applications
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Gas source MBE growth and characterization of TlInGaP and TlGaAskkkk layers for ling wavelength applications

机译:气源MBE的生长以及对ling波长应用的TlInGaP和TlGaAskkkk层的表征

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New III-V semiconductors TlInGaP and TlInGaAs (Tl composition of less than 0.1) are grown on InPk substrates by gas soruce molecualr beam epitaxy. They are proposed for long wavelength optical devices as well as temeprature insenwsitive wavelength laser diodes. Grown layers are characterized by the measurements on the temeprature variation of photoconductance and phtoluminescence. It is observed that the bandgap energy shows small-temeprature variation suggestign the existence of temeprature-independent bandgap energy in these material systems for the laeyrs with increased Tl composition.
机译:通过气体吸收分子束外延在InPk衬底上生长新的III-V族半导体T1InGaP和T1InGaAs(T1组成小于0.1)。它们被建议用于长波长光学器件以及对偶无感波长激光二极管。通过对光电导和光致发光的温度变化的测量来表征生长的层。观察到带隙能量显示出较小的温度变化,这暗示了对于具有增加的T1组成的层,在这些材料系统中存在与温度变化无关的带隙能量。

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