首页> 外文期刊>Journal of Crystal Growth >Optical property analysis of CZT:In single crystals after annealing by a two-step method
【24h】

Optical property analysis of CZT:In single crystals after annealing by a two-step method

机译:CZT的光学性能分析:退火后的两步法单晶

获取原文
获取原文并翻译 | 示例
           

摘要

Indium-doped Cd_(1-x)Zn_xTe (CZT:In) single crystals were annealed by a two-step method, including a high-temperature step and a low-temperature step in sequence. IR transmittance spectrum, I-V curve and PL spectrum were used to characterize the CZT single crystals. After annealing, the opto-electrical properties of the CZT:In crystals were improved obviously. The average IR transmittance was remarkably increased by about 23%, and the resistivity was enhanced by as high as four orders of magnitude. In the PL spectra, the intensity of the (D~0,X) peak prominently increased, and the full-width-at-half-maximum was reduced. Meanwhile, the intensity of the DAP peak decreased greatly, and the structure became practically indistinguishable from the background. Moreover, the intensity of the D_(compiex) peak also decreased. The investigation shows that these improvements in the physical properties after annealing are due to variations in the micro-structures. The two-step annealing method can eliminate precipitates/inclusions, remove impurities, compensate Cd vacancies, decrease dislocations and reduce internal stress.
机译:铟掺杂的Cd_(1-x)Zn_xTe(CZT:In)单晶通过两步法退火,包括依次进行高温步骤和低温步骤。用红外透射光谱,IV曲线和PL光谱表征了CZT单晶。退火后,CZT:In晶体的光电性能得到明显改善。平均IR透射率显着提高了约23%,电阻率提高了多达四个数量级。在PL光谱中,(D〜0,X)峰的强度显着增加,而半峰全宽减小。同时,DAP峰的强度大大降低,其结构与背景几乎没有区别。此外,D_(compiex)峰的强度也降低了。研究表明,退火后物理性能的这些改善是由于微结构的变化所致。两步退火方法可以消除析出物/夹杂物,去除杂质,补偿Cd空位,减少位错并降低内应力。

著录项

  • 来源
    《Journal of Crystal Growth》 |2010年第20期|p.2876-2880|共5页
  • 作者

    Pengfei Yu; Wanqi Jie; Tao Wang;

  • 作者单位

    State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, China School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an 710072, China;

    rnState Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, China School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an 710072, China;

    rnState Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, China School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an 710072, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    A1. Defects; A1. Impurities; B1. Cadmium compounds; B2. Semiconducting H-VI materials;

    机译:A1。缺陷;A1。杂质;B1。镉化合物;B2。半导体H-VI材料;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号