首页> 外文期刊>Journal of Crystal Growth >MBE-VLS growth of catalyst-free III-V axial heterostructure nanowires on (111 )Si substrates
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MBE-VLS growth of catalyst-free III-V axial heterostructure nanowires on (111 )Si substrates

机译:(111)Si衬底上无催化剂III-V轴向异质结构纳米线的MBE-VLS生长

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摘要

For application in novel opto-electronic nanowire devices, Ga-assisted GaAs/In_xGa_(1-x)As axial heterostructure nanowires grown on a (111)Si substrate at a high In/Ga flux ratio were investigated. The increased diameter of the In_xGa_(1-x)As region of the nanowire was observed from a scanning electron microscopy image. The In composition of 0.01 -0.02 of the In_xGa_(1-x)As was shown by EDX point analysis. The In concentration of 0.62 of an In-Ga alloy droplet was estimated from the diameter ratio of the In_xGa_(1-x)As/GaAs region. From these results, it was considered that the excess In was collected in the droplet, resulting in an increased nanowire diameter. The increased diameter of the In_xGa_(1-x)As region was also discussed together with the results of thermodynamic calculation.
机译:为了应用于新型光电纳米线器件,研究了在(111)Si衬底上以高In / Ga通量比生长的Ga辅助GaAs / In_xGa_(1-x)As轴向异质结构纳米线。从扫描电子显微镜图像观察到纳米线的In_xGa_(1-x)As区域的直径增加。通过EDX点分析显示In_xGa_(1-x)As的0.01 -0.02的In组成。从In_xGa_(1-x)As / GaAs区域的直径比推定In-Ga合金滴的In浓度为0.62。从这些结果,认为过量的In被收集在液滴中,导致纳米线直径增加。还讨论了In_xGa_(1-x)As区域直径的增加以及热力学计算的结果。

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