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High growth rate MOVPE of Al(Ga)N in planetary reactor

机译:行星反应堆中Al(Ga)N的高生长MOVPE

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摘要

Possibility of A1N growth by MOVPE in a planetary reactor with high growth rate was investigated. Growth was performed on (0001) Al_2O_3 substrates at the reactor pressure of 100 mbar. It was shown that deposition rate is close to diffusion limit at low NH_3 flows and reduces abruptly above a certain threshold value of NH_3 due to gas-phase parasitic reactions. At constant V/III ratio of 1.5-2, A1N growth rate dependence on TMAI flow was linear and a maximum growth rate of 8.6 μm/h was achieved. Process modeling allowed predicting and explaining the trends related to the onset of parasitic chemistry for various V/III ratios and other growth conditions. Surface morphology penalization was achieved by either (1) NH_3 flow rate reduction or (2) TMGa injection after the layer with thickness of 75-300 nm was grown. The second approach looks more fruitful resulting in atomically flat Al(Ga)N layers with a 2 μm/h growth rate. For the conditions (high temperature, low NH3 and high H_2 concentration) used Ga acts mostly as surfactant (Ga content in Al(Ga)N is about 3-5%).
机译:研究了MOVPE在高生长速率的行星反应堆中生长AlN的可能性。在(0001)Al_2O_3衬底上以100 mbar的反应器压力进行生长。结果表明,在较低的NH_3流量下,沉积速率接近扩散极限,并且由于气相寄生反应而突然降低到NH_3的某个阈值以上。在恒定的V / III比1.5-2时,AlN的生长速率对TMAI流量的依赖性是线性的,最大生长速率为8.6μm/ h。通过过程建模,可以预测和解释与各种V / III比率和其他生长条件下的寄生化学反应有关的趋势。在生长厚度为75-300 nm的层之后,通过(1)减少NH_3流速或(2)注入TMGa来实现表面形态的惩罚。第二种方法看起来更有成果,导致原子平坦的Al(Ga)N层具有2μm/ h的生长速率。对于条件(高温,低NH3和高H_2浓度),使用的Ga主要充当表面活性剂(Al(Ga)N中的Ga含量约为3-5%)。

著录项

  • 来源
    《Journal of Crystal Growth》 |2012年第1期|p.209-213|共5页
  • 作者单位

    Ioffe Physical-Technical Institute of the Russian Academy of Sciences, St. Petersburg 194021, Russia;

    Ioffe Physical-Technical Institute of the Russian Academy of Sciences, St. Petersburg 194021, Russia;

    Ioffe Physical-Technical Institute of the Russian Academy of Sciences, St. Petersburg 194021, Russia;

    Ioffe Physical-Technical Institute of the Russian Academy of Sciences, St. Petersburg 194021, Russia;

    Submicron Heterostructures for Microelectronics, Research & Engineering Center of the Russian Academy of Sciences, St Petersburg 794021, Russia;

    Ioffe Physical-Technical Institute of the Russian Academy of Sciences, St. Petersburg 194021, Russia;

    Ioffe Physical-Technical Institute of the Russian Academy of Sciences, St. Petersburg 194021, Russia;

    Ioffe Physical-Technical Institute of the Russian Academy of Sciences, St. Petersburg 194021, Russia;

    STR Croup Ltd., P.O. Box 89, St. Petersburg 194156, Russia;

    STR Croup Ltd., P.O. Box 89, St. Petersburg 194156, Russia;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    A1. Parasitic reactions; A1. Surface morphologyp; A3. Metalorganic vapor phase epitaxy; B1. Nitrides; B1.AlN; B1. AlGaN;

    机译:A1。寄生反应;A1。表面形态A3。金属有机气相外延;B1。氮化物;B1.AlN;B1。氮化铝镓;
  • 入库时间 2022-08-17 13:17:07

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