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Dynamical faceting and nanoscale lateral growth of GaAs by molecular beam epitaxy

机译:分子束外延生长GaAs的动力学刻面和纳米级横向生长

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摘要

Dynamical faceting during homoepitaxial growth of GaAs on nanoscale-patterned surfaces by molecular beam epitaxy is examined. Selective deposition on open GaAs (100) surfaces with lateral dimensions ranging from 130 to 250 nm, separated by 15-80 nm-wide (25-nm-thick) SiO_2 stripes aligned along the [011] direction results in facet formation and lateral growth over the SiO_2 mask. At the early stage of growth, (311) facets appear on sidewalls near the boundary between an open GaAs surface and SiO_2 mask, these are replaced by (111) facets starting from SiO_2 bounbaries as growth continues.
机译:研究了通过分子束外延在纳米尺度图案化表面上GaAs外延生长期间的动态刻面。在具有沿[011]方向排列的15-80 nm宽(25 nm厚)的SiO_2条隔开的横向尺寸范围为130至250 nm的开放式GaAs(100)表面上的选择性沉积会导致刻面形成和横向生长在SiO_2掩模上。在生长的早期阶段,(311)刻面出现在开放的砷化镓表面和SiO_2掩模之间的边界附近的侧壁上,随着生长的继续,这些刻面被(111)刻面从SiO_2边缘开始取代。

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