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A computational study of short-channel effects in double-gate junctionless graphene nanoribbon field-effect transistors

机译:双栅无结石墨烯纳米带场效应晶体管中短沟道效应的计算研究

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摘要

As the channel length shrinks below the 10-nm regime, emerging materials, junctionless technology, and multiple-gate geometries provide an excellent combination to continue progress towards lower-cost high-performance ultrascaled devices. In this study, the double-gate junctionless (JL) graphene nanoribbon field-effect transistor (GNRFET) and its conventional counterpart (C-GNRFET) are compared in terms of short-channel effects (SCEs) using a quantum simulation. The computational approach is based on solving the Schrodinger equation using the mode-space nonequilibrium Green's function formalism coupled self-consistently with a Poisson equation in the ballistic limit. The analysis of gate length downscaling shows that the JL GNRFET exhibits better leakage current, subthreshold swing (SS), drain-induced barrier lowering, and threshold voltage roll-off in comparison with the conventional GNRFET. In addition, we reveal that a decrease in the n-type doping concentration can enhance the above-mentioned characteristics of both devices. The results indicate that the JL GNRFET can mitigate critical issues and enhance the immunity to SCEs of the GNRFET, making it a promising candidate for high-performance ultrascaled (sub-5-nm) technology.
机译:随着沟道长度缩小到10nm以下,新兴的材料,无结技术和多栅极几何结构提供了极好的组合,可以继续朝着低成本高性能超大规模器件发展。在这项研究中,使用量子模拟在短沟道效应(SCE)方面比较了双栅极无结(JL)石墨烯纳米带场效应晶体管(GNRFET)和其常规对等晶体管(C-GNRFET)。该计算方法基于使用弹道极限中的模式空间非平衡格林函数形式主义和泊松方程自洽耦合求解薛定inger方程的基础。栅极长度缩小的分析表明,与传统的GNRFET相比,JL GNRFET具有更好的漏电流,亚阈值摆幅(SS),漏极引起的势垒降低和阈值电压下降。另外,我们揭示了降低n型掺杂浓度可以增强两个器件的上述特性。结果表明,JL GNRFET可以缓解关键问题并增强GNRFET的SCE免疫力,使其成为高性能超大规模(sub-5-nm)技术的有希望的候选者。

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