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首页> 外文期刊>Journal of Computational Electronics >The effects of a Stone-Wales defect on the performance of a graphene-nanoribbon-based Schottky diode
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The effects of a Stone-Wales defect on the performance of a graphene-nanoribbon-based Schottky diode

机译:Stone-Wales缺陷对基于石墨烯-纳米核的肖特基二极管性能的影响

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The effects of a Stone-Wales defect on the performance of a graphene-nanoribbon-based Schottky diode are studied herein. To this end, the transmission, energy band structure, density of states, carrier concentration, and current density of the proposed device are modeled analytically in two cases, viz. a pristine and defective graphene nanoribbon, and the results are compared. The results reveal that the introduction of a Stone-Wales defect into the symmetric graphene nanoribbon system obviously changes some of the distinctive properties. After the introduction of a Stone-Wales defect, the slope of the energy levels in the graphene nanoribbon is reduced, leading to a decrease in the Fermi velocity. In this case, the band gap near the Dirac points in the energy band structure is increased. The minimum density of states of the defect-free graphene is almost zero, which can be explained by the shape of the energy band diagram at the Dirac point. Moreover, the minimum density of states in the presence of a Stone-Wales defect is higher than in the defect-free condition, owing to the presence of bands throughout the energy diagram. Finally, the effects of the temperature and channel width on the I-V characteristic of the proposed Schottky diode based on a defect-free or defective graphene nanoribbon are studied analytically, and the efficiency of the device is investigated.
机译:本文研究了Stone-Wales缺陷对基于石墨烯-纳米碳管的肖特基二极管的性能的影响。为此,在两种情况下,即分析性地对所提出的器件的传输,能带结构,状态密度,载流子浓度和电流密度进行了建模。原始和有缺陷的石墨烯纳米带,并将结果进行比较。结果表明,将Stone-Wales缺陷引入对称的石墨烯纳米带系统明显改变了一些独特的特性。引入Stone-Wales缺陷后,石墨烯纳米带中能级的斜率减小,从而导致费米速度降低。在这种情况下,能带结构中的狄拉克点附近的带隙增加。无缺陷石墨烯的最小状态密度几乎为零,这可以通过狄拉克点处的能带图形状来解释。此外,由于整个能量图中都存在能带,因此存在Stone-Wales缺陷时的最小状态密度高于无缺陷状态。最后,分析研究了温度和沟道宽度对所提出的基于无缺陷或有缺陷的石墨烯纳米带的肖特基二极管的I-V特性的影响,并研究了器件的效率。

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