Event-Related Potentials and Recognition Memory for Low- and High-Frequency Words

摘要

Event-related potentials (ERPs) were recorded while subjects made recognition judgments on high- and low-frequency words, half of which had previously been presented in an incidental study task. Compared to high-frequency items, low-frequency words were associated with superior recognition performance, and attracted a higher proportion of confident judgments. In the case of the low-frequency words only, the region of the ERPs post-500 msec evoked by correctly classified, previously studied (old) words was more positive-going than was the same region of the EWs to nonstudied (new) words. These “oldew” ERP differences were larger from electrodes over the left than over the right hemisphere. This oldew by frequency interaction held when EWs were formed only from words that attracted confident judgments. It is argued that these data are consistent with the ideas that (1) post-500 msec “old/ new” EW differences in recognition memory tasks reflect differences in old and new words' levels of relative familiarity, and (2) the recognition memory advantage for low-frequency words results, at least in part, from the higher level of relative familiarity engendered at test by previously studied low-frequency items. The data are interpreted as providing support for “two-process” models of recognition memory.