Properties of Thin Metal Films at Microwave Frequencies

摘要

The power transmission, reflection, and absorption coefficients of thin metal films positioned in the transverse plane of a rectangular waveguide are investigated. The results are presented as a function of film thickness for iron, nickel, and silver at 9800 MHz using (a) theoretical expressions for conductivity as a function of film thickness, and (b) measured values of conductivity. Experimental transmission data were obtained and compare favorably with theory.