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Influence of sputtering pressure on the properties of hydrogenated amorphous‐silicon carbon alloy films prepared by magnetron sputtering of silicon in methane‐argon gas mixtures

机译:溅射压力对甲烷-氩气混合气体中硅磁控溅射制备的非晶硅碳氢化合金薄膜性能的影响

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The structural, optical, electrical, and optoelectronic properties of magnetron sputtered hydrogenated amorphous‐silicon carbon alloy films have been investigated as a function of sputtering pressure. The optical band gap, the activation energy of dark conductivity, and concentration of hydrogen increase with increasing sputtering pressure. The photoconductivity as well as the dark conductivity shows a maximum against pressure. These results are discussed from the standpoint of the structural and compositional change of the films with sputtering pressure, originating from the change of plasma reaction process composed of the decomposition of methane and the sputtering of silicon.
机译:研究了磁控溅射氢化非晶硅碳合金薄膜的结构,光学,电学和光电性能随溅射压力的变化。光学带隙,暗导电性的活化能和氢的浓度随溅射压力的增加而增加。光电导率和暗电导率均显示出最大的抗压性。从膜的结构和组成随溅射压力变化的观点出发,讨论了这些结果,该变化源于由甲烷分解和硅溅射组成的等离子体反应过程的变化。

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    《Journal of Applied Physics》 |1986年第7期|P.2498-2502|共5页
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  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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